RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2017 Volume 87, Issue 12, Pages 1901–1905 (Mi jtf6060)

This article is cited in 3 papers

Physical electronics

Total external reflection of X rays from polycrystal solid surface

V. M. Stozharov, V. P. Pronin

Herzen State Pedagogical University of Russia, St. Petersburg

Abstract: Total external reflection of X rays from surfaces of several polycrystalline metals is analyzed. The roentgenograms of total reflection and X-ray diffraction are comprehensively studied for nickel, copper, silver, platinum, and bismuth. Theoretical processing of experimental roentgenograms is used to calculate Xray refractive indices, number of surface crystallites, interplane distances, and remaining quantities for polycrystalline metals. It is shown that the refractive index inversely depends on the interplane distance in crystallites of polycrystalline solids. Total reflection of X rays from the lead zirconate titanate ferroelectric film is studied.

Received: 14.03.2017

DOI: 10.21883/JTF.2017.12.45218.2247


 English version:
Technical Physics, 2017, 62:12, 1899–1902

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025