Abstract:
Amplitude–frequency characteristics of the transmission coefficient of microwave waveguide photonic crystal with violation of periodicity are studied in the presence of a plane conducting small-size inclusion that occupies a part of the transverse cross section of the waveguide inside a disturbed layer located at different positions. The conducting small-size inclusion in the disturbed layer of photonic crystal causes the low-frequency shift of the defect mode in the band gap, and the maximum shift is observed when the metal inclusion is located at the interface or center of disturbance depending on the thickness of the disturbed layer.