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Zhurnal Tekhnicheskoi Fiziki, 2016 Volume 86, Issue 10, Pages 83–88 (Mi jtf6422)

Solid-State Electronics

Analysis of reliability of semiconductor emitters with different designs of cavities

A. V. Ivanov, V. D. Kurnosov, K. V. Kurnosov, Yu. V. Kurnyavko, A. V. Lobintsov, A. S. Meshkov, V. N. Penkin, V. I. Romantsevich, M. B. Uspenskiy, R. V. Chernov

Polyus Research and Development Institute named after M. F. Stel'makh, Moscow

Abstract: We have reported on the results of analysis of the operating time of conventional laser diodes and diodes with noninjecting output sections. The reasons for shorter operating time of diodes with a single anti-reflection face of the cavity compared to diodes with two protecting coatings and emitters equipped with a fiber Bragg grating have been considered.

Received: 09.07.2015
Revised: 16.02.2016


 English version:
Technical Physics, 2016, 61:10, 1525–1530

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© Steklov Math. Inst. of RAS, 2024