Abstract:
The nanostructure of amorphous granulated (Co$_{45}$Fe$_{45}$Zr$_{10}$)$_{x}$(Al$_{2}$O$_{3}$)$_{1-x}$ (0.30 $< x <$ 0.75) composite films 2.2–5.8 $\mu$m thick deposited onto a pyroceramic substrate is studied by atomic force microscopy, magnetic force microscopy, and scanning electron microscopy. The average grain size and the metallic-phase content are shown to affect the electrical conductivities of these films.
Keywords:Film Thickness, Composite Film, Surface Relief, Magnetic Force Microscopy, Total Metal Content.