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Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 6, Pages 888–893 (Mi jtf6788)

Solid-State Electronics

Formation of the light extracting surface of IR (850 nm) light-emitting diodes

A. V. Malevskaya, N. A. Kalyuzhnyy, D. A. Malevskii, A. A. Blokhin, M. V. Nakhimovich, N. D. Il'inskaya

Ioffe Institute, St. Petersburg, Russia

Abstract: Investigation of post-growth technology development of IR (850 nm) light-emitting diodes based on AlGaAs/GaAs heterostructures, grown by metalorganic vapour-phase epitaxy, has been carried out. Various methods of texturing and brightening the light extracting diode surfaces have been investigated, and a technology for forming optical elements has been developed. Analyzed was the relationship between chip formation technology and photovoltaic parameters of light-emitting diodes: electroluminescence intensity, optical power and external quantum efficiency. As a result of the developed technology, a twofold optical power value increase was achieved, which amounted > 400 mW at current 800 mA.

Keywords: IR light-emitting diode, texturing, antireflection coating, optical element.

Received: 22.02.2024
Revised: 05.04.2024
Accepted: 10.04.2024

DOI: 10.61011/JTF.2024.06.58130.47-24



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© Steklov Math. Inst. of RAS, 2025