On the correct use of refractive lenses for microscopy with high spatial resolution at fourth-generation synchrotron radiation facilities

The concept of an undulator-based beamline for refractive lenses-based hard X-ray coherent nanoscopy and nanotomography at a fourth-generation synchrotron radiation source is presented. We describe experimental scenarios and optics operational modes that allow varying the scale of the sample area under study in the range of $\sim$0.1–100 $\mu$m and achieving spatial resolution down to $\sim$10 nm. Solutions to eliminate the disadvantages of beryllium lenses are proposed.