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Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 8, Pages 1211–1216 (Mi jtf6823)

XXVIII International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 11-15, 2024
Radiophysics

Development of the cryogenic load for 1.1–1.4 mm sideband separating SIS-mixer

A. V. Khudchenkoab, K. I. Rudakovab, I. V. Tret'yakova, A. M. Chekushkinb, I. A. Mutaevc, V. P. Kosheletsab

a Astro Space Center, Lebedev Physical Institute, Russian Academy of Sciences, 117810 Moscow, Russia
b Kotelnikov Institute of Radioengineering and Electronics of the Russian Academy of Sciences, 125009 Moscow, Russia
c Moscow Institute of Physics and Technology (National Research University), 141701 Dolgoprudny, Moscow Region, Russia

Abstract: This paper describes the design of a waveguide load for a cryogenic sideband separating receiver based on SIS mixers for the 1.1–1.4 mm range. The load is designed as a metal insert in the center of the waveguide. The insert is based on 125 $\mu$m thick quartz substrate with a deposited 8 nm thick NiCr film, which has a resistance of about 250 $\Omega$/sq. Measurements demonstrate the variations of the film resistance to be within 5 percent while temperature changes from 300 to 4.2 K. Simulations show that the load reflection level can be expected to be less than -35 dB in the 220–330 GHz range.

Keywords: waveguide load, thin metal film, SIS waveguide mixers, sideband separating mixers.

Received: 19.05.2024
Revised: 19.05.2024
Accepted: 19.05.2024

DOI: 10.61011/JTF.2024.08.58548.179-24



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