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Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 8, Pages 1217–1228 (Mi jtf6824)

XXVIII International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 11-15, 2024
Electrophysics

Insertion device for EUV-lithography at fourth-generation SR facility

A. V. Murzinaab, Ya. V. Rakshunac, Yu. V. Khomyakova, V. A. Chernova

a G I. Budker Institute of Nuclear Physics, Siberian Branch of the Russian Academy of Sciences, 630090 Novosibirsk, Russia
b Novosibirsk State University, 630090 Novosibirsk, Russia
c Siberian State University of Telecommunications and Informatics, 630102 Novosibirsk, Russia

Abstract: This paper is dedicated to the optimization of the fourth-generation storage ring insertion devices for EUV lithography. Optimal period lengths have been determined, and the APPLE-II and Delta insertion devices have been compared in circular and linear polarization modes according to spectral, power characteristics, source size, and angular divergence. The average power values of the working harmonic have been obtained: about 6 W for circular polarization and about 2.6 W – for linear polarization. The coherent properties of the generated synchrotron radiation have been evaluated: the coherent fractions have been calculated, and transverse coherence functions have been obtained.

Keywords: Extreme ultra-violet lithography (EUVL), synchrotron radiation (SR), insertion device (ID), elliptical polarized undulator (EPU), partially coherent radiation.

Received: 23.04.2024
Revised: 23.04.2024
Accepted: 23.04.2024

DOI: 10.61011/JTF.2024.08.58549.129-24



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