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Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 8, Pages 1269–1279 (Mi jtf6829)

XXVIII International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 11-15, 2024
Physical electronics

Study of the structural and reflective characteristics of short-period Mo/Be multilayer X-ray mirrors

R. S. Pleshkov, S. A. Garakhin, E. I. Glushkov, V. N. Polkovnikov, E. D. Chkhalo, N. I. Chkhalo

Institute for Physics of Microstructures, 603087 Afonino, Kstovo district, Nizhny Novgorod, Russia

Abstract: A series of short-period Mo/Be multilayer mirrors (MLs) have been studied using the methods of X-ray reflectometry, diffuse X-ray scattering and interferometry. It is shown that the structure of the MLs (the presence of diffraction orders in the angular dependence of the reflection coefficient) is observed at least up to a period of 1.29 nm. Also, when approaching extremely small period values, starting from 1.64 nm, a sharp increase in the width of the transition region between the mirror layers is observed.

Keywords: multilayer X-ray mirrors, synchrotron applications, X-ray monochromator, internal stresses.

Received: 06.05.2024
Revised: 06.05.2024
Accepted: 06.05.2024

DOI: 10.61011/JTF.2024.08.58554.148-24



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© Steklov Math. Inst. of RAS, 2025