RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 8, Pages 1288–1294 (Mi jtf6831)

XXVIII International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 11-15, 2024
Physical electronics

High-gradient aspherization of substrates with thin-film Al/Si coatings

K. V. Durov, S. A. Mineev, V. N. Polkovnikov, N. I. Chkhalo

Institute of Physics of Microstructures, Russian Academy of Sciences, A.V. Gaponov-Grekhov Institute of Applied Physics RAS, 603950 Nizhny Novgorod, Russia

Abstract: The paper discusses the issues of film aspherization. A multilayer Al/Si structure has been proposed as an aspherizing coating. It was applied to a spherical surface. By selecting the ratio of materials in the period, a state was searched in which stresses in the multilayer structure were minimized. At the same time, the period of the structure of 9–10 nm corresponds to the mirrors of normal incidence for the wavelength range of 17–19 nm, which are of interest to solar astronomy. Using precision shaped diaphragms, an aspherical coating profile with a maximum height difference of $\sim$1.3 $\mu$m microns was formed between the magnetron and the substrate.

Keywords: thin films, magnetron sputtering, internal stresses, aspherization.

Received: 15.05.2024
Revised: 15.05.2024
Accepted: 15.05.2024

DOI: 10.61011/JTF.2024.08.58556.172-24



Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025