RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 94, Issue 8, Pages 1323–1330 (Mi jtf6835)

XXVIII International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 11-15, 2024
Experimental instruments and technique

Stand for testing extreme ultraviolet sensitive photoresists

A. Ya. Lopatin, V. I. Luchin, A. N. Nechai, A. A. Perekalov, A. E. Pestov, D. G. Reunov, N. I. Chkhalo

Institute for Physics of Microstructures, Russian Academy of Sciences, 603087 Afonino, Kstovo district, Nizhny Novgorod, Russia

Abstract: An experimental stand for testing photoresists sensitive to extreme ultraviolet radiation is described. The stand is based on a laser-plasma source with a Nd : YAG-laser (pulse energy 0.8 J, pulse duration 5.2 ns, focal spot diameter 66 $\mu$m, peak intensity up to 3 $\cdot$ 10$^{12}$ W/cm$^2$) and a gas jet as a target, as well as a mirror monochromator (a replaceable multilayer X-ray mirror optimized for a selected wavelength). The setup is equipped with a set of mirrors and filters for exposing samples at wavelengths of 11.2, 13.9 and 30.4 nm. Kr, Ar and He are used as working gases, the ions of which Kr X, Ar VIII and He II have intense emission bands in the vicinity of the indicated wavelengths. The stand was tested with photoresist samples, the size and shape of the focal spot were determined, which was about 0.5 $\times$ 1.0 mm$^2$.

Keywords: multilayer x-ray mirrors, monochromator, collector, x-ray and extreme ultraviolet wavelength range, photoresist, EUV lithography.

Received: 26.04.2024
Revised: 26.04.2024
Accepted: 26.04.2024

DOI: 10.61011/JTF.2024.08.58560.142-24



Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025