RUS  ENG
Full version
JOURNALS // Zhurnal Tekhnicheskoi Fiziki // Archive

Zhurnal Tekhnicheskoi Fiziki, 2023 Volume 93, Issue 7, Pages 1009–1013 (Mi jtf7042)

XXVII International Symposium "Nanophysics and Nanoelectronics" N. Novgorod, March 13-16, 2023
Physical Electronics

Features of the course of the solid-state reactions in a Sn/Fe/Cu trilayer film system

Yu. Yu. Balashova, V. G. Myagkova, L. E. Bykovaa, M. N. Volochaeva, V. S. Zhigalova, A. A. Matsynina, K. A. Galushkab, G. N. Bondarenkoa, S. V. Komogortseva

a L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, 660036 Krasnoyarsk, Russia
b Siberian Federal University, 660041 Krasnoyarsk, Russia

Abstract: Study of the mechanisms of the solid-state reactions in Sn/Fe/Cu thin films is interesting both from a fundamental point of view and from a view of the importance of emerging intermetallics in the technology of solder joints and thin-film lithium-ion batteries. By the integrated approach, including both X-ray phase analysis and local elemental analysis of the cross-sections of the films, the phase composition and the mutual arrangement of phases were studied, at various stages of the solid-state reaction occurring at different temperatures. The observed sequence of the appearing phases differs significantly from the expected one if the mass transfer took place by a volume diffusion through the forming layers.

Keywords: thin films, transmission electron microscopy, energy dispersion spectroscopy, mass transfer mechanisms.

Received: 06.04.2023
Revised: 06.04.2023
Accepted: 06.04.2023

DOI: 10.21883/JTF.2023.07.55761.73-23



Bibliographic databases:


© Steklov Math. Inst. of RAS, 2025