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Zhurnal Tekhnicheskoi Fiziki, 2025 Volume 95, Issue 1, Pages 98–106 (Mi jtf7088)

Physical science of materials

Optical, electrical and emi shielding properties of agnw thin films

A. S. Voroninabc, I. I. Bril'b, Yu. V. Fadeevab, A. Yu. Pavlikovc, M. M. Simuninbc, M. N. Volochaevd, I. V. Govorund, I. V. Podshivalovd, M. O. Makeeva, P. A. Mikhaleva, B. A. Parshina, S. V. Khartovb

a Bauman Moscow State Technical University, Moscow, Russia
b Krasnoyarsk Scientific Center of SB RAS, Krasnoyarsk, Russia
c Siberian Federal University, Krasnoyarsk, Russia
d L. V. Kirensky Institute of Physics, Siberian Branch of the Russian Academy of Sciences, Krasnoyarsk, Russia

Abstract: This paper describes the process of obtaining silver nanowires (AgNW) and the technique for producing thin films on their basis using vacuum filtration. The film thickness was specified by the volume of the base dispersion. In order to improve the physical, mechanical and adhesive properties of the films, AgNW were integrated into a polyurethane substrate. Comprehensive studies of the morphology and structure of both individual AgNWs and their films were conducted. The study of the optoelectric characteristics showed that the AgNW films have a uniform transmittance in the visible range above 500 nm. The radio shielding properties of the film structures in the K and K$_a$ ranges were also studied. It was shown that the AgNW films have a high shielding coefficient of more than 25 dB in the entire studied frequency range, while the optical transmittance at a wavelength of 550 nm was 69.25%.

Keywords: silver nanowires, agnw, shielding efficiency, thin films, electrical properties, optical properties.

Received: 10.07.2024
Revised: 30.10.2024
Accepted: 30.10.2024

DOI: 10.61011/JTF.2025.01.59465.224-24



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© Steklov Math. Inst. of RAS, 2025