Application of the GIXRD technique to investigation of damaged layers in NaNd(WO$_4$)$_2$ and NaNd(MoO$_4$)$_2$ ceramics irradiated with high-energy ions

The technique of grazing incidence X-ray diffractometry (GIXRD) was used to study damaged layers in NaNd(WO$_4$)$_2$ and NaNd(MoO$_4$)$_2$ ceramics irradiated with high-energy ions. The possibilities and applicability limits of the technique for the analysis of such samples are shown. Estimates of the degree of amorphization in near-surface layers of ceramics are given depending on the irradiation dose. The higher resistance of NaNd(MoO$_4$)$_2$ ceramics to external radiation exposure as compared to NaNd(WO$_4$)$_2$ has been demonstrated.