The method of recording the photoemission current in the process of forming a photoemission coating

A new method for recording photoemission current in the process of photocathode formation is presented, which allows, by fixing the photoemission signal without “parasitic” components in the form of leakage currents, ionization, thermal emission, to increase the quantum yield of the formed photocathode. The description of the method and the mode of its implementation is given. The results of experiments on the formation of a reflection photocathode Cs$_3$Sb using a new registration method are presented.