Abstract:
It is shown that by changing the parameters of irradiation with a pulsed nanosecond ytterbium fiber laser, it is possible to influence the information-correlation, fractal and optical properties of the surface of porous silicon films. Using the analysis of the reflection spectra and Raman scattering of light, the relationship between the parameters of laser irradiation of porous films and their optical characteristics is established. The studied semiconductor structures can be relevant for creating antireflective layers of silicon solar cells, as well as chemical sensors.
