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Zhurnal Tekhnicheskoi Fiziki, 2015 Volume 85, Issue 6, Pages 98–103 (Mi jtf7805)

Physical science of materials

Melting of a thin aluminum film on a dielectric substrate under a high-power ion beam

V. S. Kovivchak, T. V. Panova, R. B. Burlakov

Omsk State University

Abstract: The effect of a high-power ion beam on thin aluminum films (0.3 and 1.9 $\mu$m thick) deposited onto dielectric substrates made of sodium-silicate glass and pyroceramics is studied. The main stages of changes in the surface morphology of a film, namely, its melting and transformation into an array of individual metal particles, are determined. Possible mechanisms of the detected phenomena are considered.

Received: 18.08.2014


 English version:
Technical Physics, 2015, 60:6, 885–890

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