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Zhurnal Tekhnicheskoi Fiziki, 2015 Volume 85, Issue 8, Pages 116–123 (Mi jtf7862)

This article is cited in 2 papers

Optics

Waveguide spectroscopy of bilayer structures

A. B. Sotskia, L. M. Steingartb, J. H. Jacksonb, S. O. Parashkova, I. S. Dzena, L. I. Sotskayac

a Mogilev State A. A. Kuleshov University
b Metricon Corporation, 08534 Pennington, New Jersey, USA
c Belarusian-Russian University

Abstract: A least-squares procedure is proposed for the reconstruction of optical parameters of bilayer structures. The objective function is constructed using experimental and calculated data on the reflectance of a coupling prism. A structure consisting of two different silicon oxynitride films on a silicon substrate is studied. The effect of scattering on the solution of the inverse problem is analyzed.

Received: 14.11.2014


 English version:
Technical Physics, 2015, 60:8, 1220–1226

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