Universal method for experimental determination of evaporating electric field strengths for field ion emitters

An original method for experimental determination of evaporating field strengths $F_{ev}$ for field emitters is described. The method is universal and can be used for any field emitters, including nanosize protrusions grown in situ on the surface of such emitters to improve the emission localization. The examples of determining the values of $F_{ev}$ for emitters made of some metals are given and the restrictions of the method are analyzed.