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Zhurnal Tekhnicheskoi Fiziki, 2014 Volume 84, Issue 10, Pages 48–50 (Mi jtf8220)

Physical science of materials

On the possibility of elemental analysis of solid crystals by the X-ray diffraction method

V. M. Stozharov

Herzen State Pedagogical University of Russia, St. Petersburg

Abstract: A new method of elemental analysis of solid crystals by the X-ray diffraction method is proposed. The possibility of application of this method to multicomponent polymorphic systems (including a wide range of elements being analyzed and quantitative determination of their mass concentrations without using an external or internal standard) is demonstrated for natural aluminum silicate and titanium oxide samples as examples.

Received: 10.09.2013


 English version:
Technical Physics, 2014, 59:10, 1466–1469

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© Steklov Math. Inst. of RAS, 2025