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Zhurnal Tekhnicheskoi Fiziki, 2013 Volume 83, Issue 9, Pages 73–83 (Mi jtf8538)

This article is cited in 7 papers

Solid-State Electronics

Crystallization and thermochromism of annealed heterostructures containing titanium and tungsten oxide films

V. I. Shapovalova, A. E. Lapshinb, A. E. Komleva, M. Yu. Arsent'evb, A. A. Komleva

a Saint Petersburg Electrotechnical University "LETI"
b I. V. Grebenshchikov Institute of Silicate Chemistry of the Russian Academy of Sciences, St. Petersburg

Abstract: Crystalline phases in heterostructures containing titanium and tungsten oxide films are studied after step annealing in vacuum at temperatures between 500 and 750$^\circ$C. The films are deposited on a silica glass substrate by dc reactive magnetron sputtering. It is found that crystalline phases in single layers and bilayer structures form in a different way. In the latter, crystallization is influenced by the order of layer arrangement on the substrate. Thermochromism in structures annealed in vacuum is due to the oxygen-deficient phase WO$_{3-x}$ belonging to the hexagonal syngony. This phase intensely grows as the temperature rises from 650 to 750$^\circ$C.

Received: 15.05.2012


 English version:
Technical Physics, 2013, 58:9, 1313–1322

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