Brief Communications

CHARACTERISTICS OF BRAGG REFLECTION FROM THE MULTILAYERED TITANIUM-SILICON STRUCTURE NEAR THE K-EDGE OF SILICON ABSORPTION

V. V. Kondratenko, I. F. Mikhaĭlov, A. G. Ponomarenko, A. V. Steblenko

Khar'kov Polytechnical Institute

UDC: 548.73/.75 : 539.24/.27

Received: 11.07.1986

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