Mendeleev Commun., 2004 Volume 14, Issue 4, Pages 155–157
(Mi mendc3852)
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2 papers
The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy O. V. Kotova a ,
S. V. Eliseeva b ,
E. V. Perevedentseva c ,
T. F. Limonova c ,
R. A. Baigeldieva c ,
A. G. Vitukhnovsky c ,
N. P. Kuzmina b a Department of Materials Science, M.V. Lomonosov Moscow State University, Moscow, Russian Federation b Department of Chemistry, M.V. Lomonosov Moscow State University, Moscow, Russian Federation c P.N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow, Russian Federation Abstract:
The layer-by-layer roughness of organic light-emitting diode (OLED)-component functional thin films deposited from different solvents by a spin-coating method was studied using atomic force microscopy (AFM) facilities
Language: English
DOI:
10.1070/MC2004v014n04ABEH001963
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