Lateral photoresistor as a versatile device platform for stability assessment of organic semiconductors

We address the challenge of the reliable stability assessment of organic semiconductors and propose a solution based on the application of a very simple lateral photoresistor device structure as a versatile test platform. The device, which consists of the semiconductor films deposited on the laserpatterned electrodes, could be exposed to different stress factors, and the evolution of the electrical characteristics of the active material (basically, its ability to transport charges) can be monitored using current–voltage measurements under steady-state or dynamic light exposure. This approach has been successfully applied to evaluate the radiation hardness and the UV light photostability of a model set of conjugated polymers.