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JOURNALS // Matematicheskie Zametki // Archive

Mat. Zametki, 2020 Volume 107, Issue 4, Pages 591–603 (Mi mzm12374)

This article is cited in 5 papers

Short Tests of Closures for Contact Circuits

K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow

Abstract: The problem of representing Boolean functions by two-pole contact circuits that are irredundant and admit short fault detection or diagnostic tests of closures of at most $k$ contacts for a given positive integer $k$ is considered. The following assertions are proved: for almost every Boolean function of $n$ variables, the minimal length of a fault detection (diagnostic) test is equal to $2$ (does not exceed $2k+2$, respectively).

Keywords: contact circuit, contact closure, fault detection test, diagnostic test.

UDC: 519.718.7

Received: 10.03.2019
Revised: 23.07.2019

DOI: 10.4213/mzm12374


 English version:
Mathematical Notes, 2020, 107:4, 653–662

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© Steklov Math. Inst. of RAS, 2025