This article is cited in 1 paper

Brief Communications

On Test Sets Concerning Local Stuck-at Faults of Fixed Multiplicity at the Inputs of Circuits

G. Antyufeev, D. S. Romanov<sup>a

a</sup> Lomonosov Moscow State University

Keywords: Boolean function, detection test, diagnostic test, Shannon function, stuck-at faults at the inputs of circuits.

MSC: 94C12, 94C11, 06E30

Received: 15.11.2022
Revised: 18.03.2023

DOI: 10.4213/mzm13812

 English version: Mathematical Notes, 2023, 114:3, 397–402

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