Easy-to-test circuits in the Zhegalkin basis with arbitrary constant faults of gates

Yu. V. Borodina, K. A. Popkov

Keldysh Institute of Applied Mathematics of Russian Academy of Sciences, Moscow

UDC: 519.718.7

MSC: 94C12

Received: 10.05.2025
Accepted: 15.10.2025

DOI: 10.4213/mzm14729