Abstract:
We investigate the internal structure and dynamics of transverse domain walls in amorphous, stressed ferromagnetic microwires by comparing two magnetoelastic anisotropy models. In the complete model, all three principal stress components (axial, radial, circumferential) extracted from a realistic stress profile are converted into spatially varying anisotropies; in the reduced model, only the dominant stress component in each radial region is retained. Micromagnetic simulations reveal that the reduced model produces exaggerated peripheral deviations-stronger radial magnetization projections and deeper penetration of the disturbed layer-compared to the complete model. Energy analysis show that omitting non-dominant anisotropy leads to underestimation of domain wall-defect interactions and a sharp, shell-like radial ordering at higher values of surface anisotropy. Furthermore, dissipation calculations based on the Thiele approach indicate that the reduced model overestimates domain wall velocity by up to 50%. These results demonstrate that incorporating the full stress tensor is essential for accurate prediction of both static domain wall profiles and their dynamic response in stressed microwires.