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JOURNALS // Computing, Telecommunication and Control // Archive

St. Petersburg Polytechnical University Journal. Computer Science. Telecommunication and Control Sys, 2016 Issue 2(241), Pages 39–44 (Mi ntitu153)

Hardware of computer, Telecommunications and Control Systems

About the reliability of components of electronic devices by electrical breakdown of the structures of metal-polymer-metal

N. T. Sudara, N. L. Egoricheva, V. A. Zakrevskiib, V. A. Pakhotinb

a Peter the Great St. Petersburg Polytechnic University
b Ioffe Physico-Technical Institute, Russian Academy of Sciences, St. Petersburg

Abstract: Electrical breakdown structures of metal-polymer-metal differing nature and thickness of the polymer films was studied in this paper. Structures with films of polymethylmethacrylate, polycarbonate and polystyrene have been investigated. It has been found that the duration of current pulses detected in the breakdown of the polymer film does not exceed 500 ns. Nature polymeric dielectric does not affect the shape and parameters recorded in the breakdown of the current pulses. Importance has a film thickness. In the breakdown of the polymer films thicker than 0.5 microns having electrical overvoltage of short duration. Their value is several times greater than the magnitude of the breakdown voltage.

Keywords: polymers, electrical breakdown, films, capacitors.

UDC: 621.315.6

DOI: 10.5862/JCSTCS.241.4



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