$X$– ray interferometric study of residual microtensions in $\mathrm{Si}$ monocrystalls

Residual microtensions are experimentally found in sicilium monocrystal using the $X$–ray interferometric method of pendellosung fringes. Relative deformations in the crystal lattice are estimated with the help of $X$–ray interferograms obtained after the laser irradiation.