RUS  ENG
Full version
JOURNALS // Optics and Spectroscopy // Archive

Optics and Spectroscopy, 2020 Volume 128, Issue 3, Pages 416–421 (Mi os457)

This article is cited in 1 paper

Optics of surfaces and interfaces

The contribution of thin absorbing layers to reflection spectra

A. V. Mikhailova, V. L. Kuz'minb

a Saint Petersburg State University
b Peter the Great St. Petersburg Polytechnic University

Abstract: The issue of the contribution from thin surface layers to reflection spectra is considered. The reflection coefficients for the two polarizations of the incident radiation are calculated taking into account the surface-layer anisotropy. It is shown that results obtained are important for use in the modern method of infrared reflection–absorption spectroscopy. The obtained solution is shown to be a generalization of a previously developed approach, which has become widespread, to the case of absorption.

Keywords: thin surface layers, reflection coefficients.

Received: 07.11.2019
Revised: 25.11.2019
Accepted: 02.12.2019

DOI: 10.21883/OS.2020.03.49069.301-19


 English version:
Optics and Spectroscopy, 2020, 128:3, 404–409

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024