I. D. Venevtsev, P. A. Rodnyi, A. È. Muslimov, V. M. Kanevskii, V. A. Babaev, A. M. Ismailov, “X-ray luminescence of zinc oxide thick films”, Optics and Spectroscopy, 2019, Volume 127, Issue 6,Pages <nobr>981

This article is cited in 2 papers

Optical materials

X-ray luminescence of zinc oxide thick films

I. D. Venevtsev^a, P. A. Rodnyi^a, A. È. Muslimov^b, V. M. Kanevskii^b, V. A. Babaev^c, A. M. Ismailov^c

^a Peter the Great St. Petersburg Polytechnic University, 195251, St. Petersburg, Russia
^b Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences, 119333, Moscow, Russia
^c Dagestan State University, 367000, Makhachkala, Russia

Abstract: Samples of thick (about 30 $\mu$m) films of undoped zinc oxide on sapphire prepared by magnetron sputtering using an uncooled target have been investigated. The structural and luminescence properties of the initial films and films subjected to additional recrystallization annealing in air have been studied. The time and temperature-dependent characteristics of the samples are considered. It is shown that annealing in air enhances the structural, optical, and luminescence properties of these films.

Keywords: ZnO thick films, magnetron sputtering method, ZnO green luminescence, temperature dependence of X-ray luminescence, electron microscopy, uncooled target.

Received: 09.08.2019
Revised: 09.08.2019
Accepted: 09.09.2019

DOI: 10.21883/OS.2019.12.48696.250-19