Abstract:
The analysis of voltage-current and voltage-farad characteristic of SiO$_2$/ZnO/Si-structures are described. SiO$_2$/ZnO/Si structures are synthesized by sol-gel metrod with using of zinc nitrate, chloride and acetate as initials. The defects density on the ZnO/Si boundary by Mott-Shottky relationship Ñ$_2$(U) is calculated. The main conductivity mechanism (space-charge limited current) is determined. It is shown that sol-gel films synthesized from zinc acetate have good photosensitivity.
Keywords:sol-gel, ZnO, voltage-current and voltage-farad characteristic.