Structural properties of $\mathrm{Pb}_{1-x}\mathrm{Sn}_x\mathrm{Te}$ thin films prepared by the “hot wall” method

In this paper, crystalline microstructure, chemical composition and morphology of $\mathrm{Pb}_{1-x}\mathrm{Sn}_x\mathrm{Te}$ thin films with the composition range of $0,05\leqslant x \leqslant 0,80$ prepared by the “hot wall” method on glass substrates were investigated. The $\mathrm{X}$-ray diffraction studies showed a polycrystalline single phase cubic crystalline structure with the dependence of the lattice constant on composition $x$ with a linear behavior described by the Vegard's law. The energy dispersive analysis showed that the obtained films are homogeneous and the compositions of the films are reproducible. Scanning electron microscopy revealed the thin films microstructure consisted of densely packed crystals with dimensions of $0,3$–$4,0$ $\mu$m and crystallite growth direction is perpendicular to substrate plane.