Abstract:
The data of the influence of the impurity $\mathrm{Nb}$, $\mathrm{La}$ and annealing temperature on the structural characteristics of the layers $\mathrm{SrBi_2(Ta_xMe_{1-x})_2O_9}$ are discussed. As research methods the atomic force microscopy and $\mathrm{X}$-ray diffraction method were used.
Keywords:sol-gel method, ferroelectric sol, heat treatment, SBT-film perovskite, $\mathrm{X}$-ray diffraction method, method of atomic force microscopy.