Formation, structural and morphological properties of thin films of Cu-Sn-Ni precursors

The results of the formation of Cu-Sn-Ni precursors by electrochemical deposition on glass substrates with a molybdenum sublayer are presented. The structural and morphological properties of precursors have been studied. The X-ray diffraction patterns showed characteristics of CuSn hexagonal phase, CuNi cubic phase, Ni$_3$Sn cubic phase, and Ni cubic phase. The peaks corresponding to the substrate material, molybdenum, were also found on the X-ray diffraction pattern of the precursors.