Short Notes

Effect of Radiation-Induced Defects on Current-Voltage Characteristic of Silicon Multilayer Structures

A. S. Zubrilov, V. A. Kuz'min, T. T. Мnatsakanov, L. I. Pomortseva, V. B. Shuman

Russian Electrotechnical Institute Named after V. I. Lenin

UDC: 621.315.592

Received: 07.01.1985
Accepted: 24.06.1985