Short Notes

Characteristic X-Ray Radiation Study of Disturbances in Low-Lying Levels in InSb Implanted Single Crystals

V. K. Vasil'ev, O. N. Gorshkov, Yu. A. Danilov, V. S. Tulovchikov

Gor'kii Research Institute of Physics and Technology

UDC: 621.315.592

Received: 14.10.1982
Accepted: 20.07.1983