Short Notes

Injection Annealing of Radiation-Induced Defects in $p$-Typc Silicon in an Electric Field at ${78\div330}$ K

P. V. Kuchinsky, V. M. Lomako, A. P. Petrunin

A. N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State University, Minsk

UDC: 621.315.592

Received: 24.07.1985
Accepted: 16.10.1985