Short Notes

Trapping of Carriers in Insulator–Semiconductor Structures Produced by MOS Hydride Method in the GaAs-AlAs System

E. A. Il'ichev, Yu. P. Masloboev, V. M. Maslovskii, É. A. Poltoratskiĭ, A. V. Rodionov, Yu. V. Slepnev


UDC: 621.315.592

Received: 28.03.1985
Accepted: 01.11.1985