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Fizika i Tekhnika Poluprovodnikov, 2021 Volume 55, Issue 11, Pages 1040–1044 (Mi phts4939)

Surface, interfaces, thin films

Optical and structural properties of Hg$_{0.7}$Cd$_{0.3}$Te epitaxial films

D. A. Andryushchenkoa, M. S. Ruzhevicha, A. M. Smirnova, N. L. Bazhenovb, K. J. Mynbaevb, V. G. Remesnikc

a St. Petersburg National Research University of Information Technologies, Mechanics and Optics
b Ioffe Institute, St. Petersburg
c Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Abstract: The results of comparative studies of the optical and structural properties of Hg$_{0.7}$Cd$_{0.3}$Te bulk crystals and epitaxial films grown by various methods are presented. The data of photoluminescence studies performed in the temperature range 4.2–300K showed the similarity of the optical properties of different samples and indicated a significant disordering of the solid solution. According to X-ray diffraction data, however, the scale of the disordering was not directly related to the structural quality of the material. The prospects for using the material grown by various methods in optoelectronics applications are discussed.

Keywords: HgCdTe, defects, luminescence, X-ray diffraction.

Received: 31.05.2021
Revised: 06.06.2021
Accepted: 06.06.2021

DOI: 10.21883/FTP.2021.11.51558.9689



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