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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2021 Volume 55, Issue 11, Pages 1068–1076 (Mi phts4943)

Micro- and nanocrystalline, porous, composite semiconductors

System of localized excitons on oxygen complexes in CdS

N. K. Morozovaa, I. N. Miroshnikovaab

a National Research University "Moscow Power Engineering Institute"
b Institute of Nanotechnologies of Microelectronics, Russian Academy of Sciences

Abstract: Intense CdS luminescence in the blue and green spectral regions is widely used in all areas of optoelectronics. In this spectrum band are working on lasers CdS. This paper presents the results of a study of the exciton region of the CdS spectrum based on the theory of anti-intersecting bands (bands anticrossing theory - BAC) with the involvement of broader initial data for the analysis of optical properties. Depending on the growth conditions of CdS, the presence and change in the oxygen concentration, as well as the equilibrium of intrinsic point defects, which determines the change in the composition of the crystals. The concept of the nonuniform distribution of isoelectronic centers in the bulk of CdS due to their predominant segregation on compensating stacking faults is introduced. Cathodoluminescence (CL) spectra were studied using various recording methods, excitation intensity and temperature, as well as pulsed CL at high excitation intensities. In a scanning electron microscope from local registration and a high excitation density, the emission of the edge luminescence components of CdS was detected at 300 K To analyze the optical data, we used the capabilities of the method for constructing band models based on the BAC theory, which. collects extensive and multilateral information about specific samples. A model of a CdS$\cdot$O multizone with stacking faults is presented, which determines the spectrum of edge emission. An explanation of the nature of the green edge emission of cadmium sulfide as excitons localized on oxygen-containing complexes in SF layers has been obtained for the first time. It was found that the system of levels of localized excitons at stacking faults does not change either with temperature up to 300 K, or with a change in the oxygen solubility in the crystal to the limiting one. It is shown that the presence of isoelectronic oxygen centers appear itself in the electro-physical properties of crystals. Recommendations are given for the diagnostics of crystals suitable for the creation of luminescent systems or lasers that are stable in operation.

Keywords: isoelectronic centers, bands anticrossing theory, localized exciton, stacking faults, point defects, stimulated radiation.

Received: 14.05.2021
Revised: 15.06.2021
Accepted: 15.06.2021

DOI: 10.21883/FTP.2021.11.51562.9650



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