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Fizika i Tekhnika Poluprovodnikov, 2021 Volume 55, Issue 10, Pages 846–849 (Mi phts4950)

XXV International Symposium "Nanophysics and Nanoelectronics", Nizhny Novgorod, March 9-12, 2021

Experimental studies of modification of the characteristics of GaAs structures with Schottky contacts after exposure to fast neutrons

E. V. Volkovaa, A. B. Loginovb, B. A. Loginovc, E. A. Tarasovaa, A. S. Puzanova, S. A. Korolevd, E. S. Semyonovykha, S. V. Khazanovaa, S. V. Obolenskya

a Lobachevsky State University of Nizhny Novgorod
b Lomonosov Moscow State University
c National Research University of Electronic Technology
d Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhnii Novgorod

Abstract: The electrophysical parameters and surface morphology of GaAs $n/n^-$ structures with Schottky contacts before and after neuron impact with an average energy of about 1 MeV were studied. Changes in the profiles of the concentration and mobility of electrons in the structures were determined by the C-V method measurements. The method of atomic force microscopy helped to find radiation defect clusters which appearing during impact. A complex approach to the determination of their parameters is proposed.

Keywords: GaAs structure, Schottky contacts, fast neutrons.

Received: 12.04.2021
Revised: 19.04.2021
Accepted: 19.04.2021

DOI: 10.21883/FTP.2021.10.51431.19


 English version:
Semiconductors, 2021, 55:12, 903–906

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© Steklov Math. Inst. of RAS, 2024