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Fizika i Tekhnika Poluprovodnikov, 2021 Volume 55, Issue 9, Pages 725–728 (Mi phts4972)

This article is cited in 5 papers

XXV International Symposium "Nanophysics and Nanoelectronics", Nizhny Novgorod, March 9-12, 2021

Atomic structure and optical properties of CaSi$_2$ layers grown on CaF$_2$/Si substrates

V. A. Zinov'eva, A. V. Katsyubaa, V. A. Volodinab, A. F. Zinov'evaab, S. G. Cherkovaa, Zh. V. Smaginaa, A. V. Dvurechenskiiab, A. Yu. Krupinc, O. M. Borodavchenkod, V. D. Zhivulkod, A. V. Mudryid

a Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
b Novosibirsk State University
c Novosibirsk State Technical University
d Scientific-Practical Materials Research Centre of NAS of Belarus

Abstract: In this work, we study the growth features, as well as the structural and optical properties of CaSi$_2$ layers formed in the process of successive deposition of Si and CaF$_2$ on a Si (111) substrate with simultaneous irradiation with high energy electron beam. The Raman spectra recorded in the regions of the electron beam action showed peaks characteristic of crystalline CaSi$_2$ layers. The study of the surface morphology of the grown structures demonstrated that, under the chosen synthesis conditions, the formation of CaSi$_2$ layers during electron irradiation occurs according to a two-dimensional layer mechanism. The photoluminescence spectra measured in the region modified by the electron beam have significant differences from the spectra measured outside this region.

Keywords: calcium silicides, calcium fluoride, molecular-beam epitaxy, electron irradiation, atomic structure, photoluminescence.

Received: 12.04.2021
Revised: 19.04.2021
Accepted: 19.04.2021

DOI: 10.21883/FTP.2021.09.51284.11


 English version:
Semiconductors, 2021, 55:10, 808–811

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