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Fizika i Tekhnika Poluprovodnikov, 2020 Volume 54, Issue 11, Pages 1211–1216 (Mi phts5122)

This article is cited in 2 papers

Surface, interfaces, thin films

Effect of the disordering of thin surface layers on the electronic and optical properties of Si(111)

B. E. Umirzakova, D. A. Tashmukhamedovaa, A. K. Tashatovb, N. M. Mustafoevab, D. M. Muradkabilova

a Tashkent State Technical University
b Qarshi Davlat Univesity

Abstract: The degree of disordering and the thickness $d$ of disordered layers and their effect on the band gap $E_g$ of single-crystal Si(111) under Ar$^+$-ion bombardment are studied for the first time. It is shown that the $d$ value at ion energies of $E_0$ = 1 and 2 keV is (100–120) and $\sim$(150–160) $\mathring{\mathrm{A}}$, respectively. In this case, the density of states of electrons in the Si(111) valence band significantly changes, the light transmittance decreases to $K$ = 55–60%, and the $E_g$ value increases by $\sim$10%. Under Ni$^+$-ion bombardment, surface disordering is accompanied by a sharp change in the composition of the surface layers and, as a result, the $K$ value decreases to 5–10%. After heating at $T$ = 900 K, nanocrystals (at doses of $D\le$ 10$^{15}$ cm$^{-2}$) and NiSi$_2$ nanofilms (at $D$ = 6 $\times$ 10$^{16}$ cm$^{-2}$) are formed.

Keywords: ion bombardment of Si, electronic properties, optical properties, thin layers, annealing.

Received: 20.05.2019
Revised: 13.07.2019
Accepted: 20.07.2019

DOI: 10.21883/FTP.2020.11.50088.9162


 English version:
Semiconductors, 2020, 54:11, 1424–1429

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© Steklov Math. Inst. of RAS, 2024