Structure and optical properties of chalcogenide glassy As–Ge–Te semiconductor

The structure and optical properties of a chalcogenide glassy As–Ge–Te semiconductor film are studied by X-ray diffraction analysis, Raman spectroscopy, and optical transmission and density measurement. The main structural elements and chemical bonds forming an amorphous matrix as well as the optical width of the band gap are determined. The results are explained taking into account the main principles of chemical ordering and short-range order parameters in the atomic arrangement.