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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2020 Volume 54, Issue 7, Pages 654–662 (Mi phts5208)

Semiconductor structures, low-dimensional systems, quantum phenomena

Scattering matrix method for calculating the spontaneous-emission probability in cylindrically symmetric structures

V. V. Nikolaeva, K. A. Ivanovbc, K. M. Morozovbc, A. V. Belonovskiid

a Ioffe Institute, St. Petersburg
b St. Petersburg National Research University of Information Technologies, Mechanics and Optics
c Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
d St. Petersburg National Research Academic University, Russian Academy of Sciences;ITMO University

Abstract: A method is developed for analyzing spontaneous-emission modification in cylindrically symmetric structures. A matrix method is developed for cylindrical structures. General expressions for the radiative-recombination rate are derived for an emitter placed at any point on the structure. Quantitative indicators for estimating radiative-recombination enhancement and suppression are determined; they can be considered as modal Purcell factors. An expression for the total Purcell factor is derived for an emission direction perpendicular to the symmetry axes of the medium; as well as an expression for the integral (total) Purcell factor for the emitter at the symmetry axis.

Keywords: nanophotonics, spontaneous radiative recombination, Purcell effect.

Received: 16.12.2019
Revised: 20.02.2019
Accepted: 20.02.2019

DOI: 10.21883/FTP.2020.07.49506.9336


 English version:
Semiconductors, 2020, 54:7, 765–773

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© Steklov Math. Inst. of RAS, 2024