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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 12, Pages 1726–1732 (Mi phts5343)

This article is cited in 3 papers

Manufacturing, processing, testing of materials and structures

The metal-assisted photochemical etching of N- and Ga-face GaN epitaxial layers

D. V. Mokhova, T. N. Berezovskayaab, E. V. Nikitinaa, K. Yu. Shubinaa, A. M. Mizerova, A. D. Bouravlevabc

a Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Ioffe Institute, St. Petersburg
c Saint Petersburg Electrotechnical University "LETI"

Abstract: The results of the study of photochemical etching without the application of external voltage, structures with Ga- and N-polar GaN layers synthesized by molecular beam epitaxy with plasma activation of nitrogen are presented. It is shown that the etching rate of layers with different polarities is very different. In this case, the use of gold-based masks for etching of GaN layers instead of titanium also makes it possible to increase the etching rate of the layers.

Keywords: GaN layers, photochemical etching, metal-assisted.

Received: 23.07.2019
Revised: 29.07.2019
Accepted: 29.07.2019

DOI: 10.21883/FTP.2019.12.48635.9220


 English version:
Semiconductors, 2019, 53:12, 1717–1723

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