RUS  ENG
Full version
JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 11, Pages 1579–1583 (Mi phts5368)

This article is cited in 2 papers

Manufacturing, processing, testing of materials and structures

Changes in the photoluminescence properties of semiconductor heterostructures after ion-beam etching

Ya. V. Levitskii, M. I. Mitrofanov, G. V. Voznyuk, D. N. Nikolaev, M. N. Mizerov, V. P. Evtikhiev

Ioffe Institute, St. Petersburg

Abstract: The ion-beam etching of AlGaAs/GaAs heterostructures gives rise to radiation defects and, as a result, leads to photoluminescence quenching. Annealing at 620°C in an atmosphere of As almost completely restores the quantum efficiency of photoluminescence in the case of radiation-induced defects lying at a distance of up to 150 nm from the heterointerface.

Keywords: focused ion beam, direct ion lithography, nanolithography, radiation defects, annealing, microphotoluminescence.

Received: 22.04.2019
Revised: 11.05.2019
Accepted: 13.05.2019

DOI: 10.21883/FTP.2019.11.48459.9146


 English version:
Semiconductors, 2019, 53:11, 1545–1549

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024