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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 7, Pages 1006–1009 (Mi phts5469)

This article is cited in 7 papers

Manufacturing, processing, testing of materials and structures

Properties of semipolar GaN grown on a Si(100) substrate

V. N. Bessolova, E. V. Konenkovaa, T. A. Orlovaa, S. N. Rodina, N. V. Seredovaa, A. V. Solomnikovab, M. P. Scheglova, D. S. Kibalovc, V. K. Smirnovc

a Ioffe Institute, St. Petersburg
b Saint Petersburg Electrotechnical University "LETI"
c Quantum Silicon OOO, Moscow, Russia

Abstract: Semipolar GaN layers synthesized on a nanostructured Si(100) substrate are studied. It is shown that using a Si(100) nanoprofile combined with Si$_ x$ N$_ y$ nanostrips on top of nanostructures can yield, via metal-organic chemical-vapor deposition, GaN(10$\bar1$2) layers. An additional SiC buffer layer makes it possible to obtain GaN(10$\bar1$1) layers with a full-width at half-maximum of the diffraction-curve of $\omega_\theta\approx$ 35' arcmin. It is found that the luminescence properties of the semipolar layers are mostly due to basal plane stacking faults BSF$_ S$ -I$_1$, in contrast to polar layers in which these properties are mostly due to the recombination of excitons.

Received: 17.12.2018
Revised: 22.12.2018
Accepted: 25.12.2018

DOI: 10.21883/FTP.2019.07.47881.9049


 English version:
Semiconductors, 2019, 53:7, 989–992

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